Company Description (as filed with the SEC)
Aehr Test develops, manufactures and sells systems which are designed to reduce the cost of testing flash, dynamic random access memory, or DRAM, and other memory devices, and to perform reliability screening, or burn-in, of complex logic and memory devices. These systems can be used to simultaneously perform parallel testing and burn-in of packaged integrated circuits, or ICs, singulated bare die or ICs still in wafer form. Leveraging its expertise as a long-time leading provider of burn-in equipment, with over 2,500 systems installed worldwide, the Company has developed and introduced several innovative product families, including the ABTSTM, FOXTM, MTX and MAX systems, the WaferPakTM cartridge and the DiePak(R) carrier. The new ABTS family of systems can perform test during burn-in on both logic and memory packaged ICs. ... More ...